Workshop on Environmental Electron Microscopies - Present in the media

Environmental scanning and transmission electronic microscopies (ESEM, ETEM) allow the characterization of non-conductive samples, as well as vacuum-sensitive or polluting objects. ESEM and ETEM differ from conventional SEM or TEM since the sample is not put under high vacuum conditions but in a gaseous environment. Moreover, in situ dynamic phenomena can be followed on a wide range of materials (metals, ceramics, polymers, hydrated or biological samples,…). One can indeed study microstructural changes under gaseous or liquid environment, or even during mechanical tests, high temperature treatments, and chemical reactions. The workshop will include lectures giving the theoretical background, the main advantages and challenges of environmental electron microscopies.
Demonstrations will be made on several microscopes or sample holders, to illustrate some experimental key steps.

Schedule here

Online Registration via www.sfmu.fr

Present in the media : Article "Le progrès" du 28 aout 2016